Understanding Package Crack Signatures in a Leadframe Semiconductor Package
نویسندگان
چکیده
منابع مشابه
Comparison in between Good and Oxidized Leadframe: a Case Study in Package Delamination Analysis
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ژورنال
عنوان ژورنال: Journal of Engineering Research and Reports
سال: 2021
ISSN: 2582-2926
DOI: 10.9734/jerr/2021/v20i317274